In situ observation of the orientation relationship at the interface plane between substrate and nucleus using X-ray scattering techniques

Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with a specific crystal plane of a solid substrate. The diffraction data reveal the orientation relationship between the substrate and the nucleus, in particular the interface plane, and its influence on the required undercooling for nucleation.