Nano-structural variations of ZnO:N thin films as a function of deposition angle and annealing conditions: XRD, AFM, FESEM and EDS analyses

Nano-structural variations of ZnO:N thin films as a function of deposition angle and annealing conditions: XRD, AFM, FESEM and EDS analyses

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 214, 1 August 2018, Pages 402-420

H. Savaloni, Rojan Savari,