Antireflective ultra-fast nanoscale texturing for efficient multi-crystalline silicon solar cells

133(a) Reflectance of nT-mc-Si samples (S30, S60, S120) prepared for different etch time and that of chemically polished (control) silicon (SCP) measured using integrating sphere, (b) solar weighted reflectance (SWR) of the nT-mc-Si samples with texturing/etch time (c) optical images of nT-mc-Si samples.