کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7970208 1514380 2015 41 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality
چکیده انگلیسی
Based upon recent developments towards a standard material for assessing strain mapping techniques, this paper assesses the overall accuracy of the simulated pattern technique. Mismatch strains are calculated using both the real and simulated pattern techniques for a SiGe film deposited on a Si substrate. While the simulated pattern technique is not as accurate or precise as the real pattern technique for providing relative strains, it provides an estimate of absolute strain that is not available via the real pattern approach.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 107, September 2015, Pages 270-277
نویسندگان
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