کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8039218 1518601 2018 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
ترجمه فارسی عنوان
نقشه برداری عنصری نمونه های بزرگ با استفاده از تجزیه و تحلیل پرتوهای یونی خارجی با رزولوشن چند میلیمتر و کاربرد آن
کلمات کلیدی
نقشه برداری عنصری، تجزیه و تحلیل پرتو یون، پرتو خارجی، منطقه بزرگ،
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
چکیده انگلیسی
The elemental mapping of large areas using ion beam techniques is a desired capability for several scientific communities, involved on topics ranging from geoscience to cultural heritage. Usually, the constraints for large-area mapping are not met in setups employing micro- and nano-probes implemented all over the world. A novel setup for mapping large sized samples in an external beam was recently built at the University of São Paulo employing a broad MeV-proton probe with sub-millimeter dimension, coupled to a high-precision large range XYZ robotic stage (60 cm range in all axis and precision of 5 μm ensured by optical sensors). An important issue on large area mapping is how to deal with the irregularities of the sample's surface, that may introduce artifacts in the images due to the variation of the measuring conditions. In our setup, we implemented an automatic system based on machine vision to correct the position of the sample to compensate for its surface irregularities. As an additional benefit, a 3D digital reconstruction of the scanned surface can also be obtained. Using this new and unique setup, we have produced large-area elemental maps of ceramics, stones, fossils, and other sort of samples.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 422, 1 May 2018, Pages 68-77
نویسندگان
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