کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8039344 1518606 2018 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High energy PIXE: A tool to characterize multi-layer thick samples
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
High energy PIXE: A tool to characterize multi-layer thick samples
چکیده انگلیسی
High energy PIXE is a useful and non-destructive tool to characterize multi-layer thick samples such as cultural heritage objects. In a previous work, we demonstrated the possibility to perform quantitative analysis of simple multi-layer samples using high energy PIXE, without any assumption on their composition. In this work an in-depth study of the parameters involved in the method previously published is proposed. Its extension to more complex samples with a repeated layer is also presented. Experiments have been performed at the ARRONAX cyclotron using 68 MeV protons. The thicknesses and sequences of a multi-layer sample including two different layers of the same element have been determined. Performances and limits of this method are presented and discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 417, 15 February 2018, Pages 41-45
نویسندگان
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