کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8039593 1518637 2016 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The CT Scanner Facility at Stellenbosch University: An open access X-ray computed tomography laboratory
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
The CT Scanner Facility at Stellenbosch University: An open access X-ray computed tomography laboratory
چکیده انگلیسی
The Stellenbosch University CT Scanner Facility is an open access laboratory providing non-destructive X-ray computed tomography (CT) and a high performance image analysis services as part of the Central Analytical Facilities (CAF) of the university. Based in Stellenbosch, South Africa, this facility offers open access to the general user community, including local researchers, companies and also remote users (both local and international, via sample shipment and data transfer). The laboratory hosts two CT instruments, i.e. a micro-CT system, as well as a nano-CT system. A workstation-based Image Analysis Centre is equipped with numerous computers with data analysis software packages, which are to the disposal of the facility users, along with expert supervision, if required. All research disciplines are accommodated at the X-ray CT laboratory, provided that non-destructive analysis will be beneficial. During its first four years, the facility has accommodated more than 400 unique users (33 in 2012; 86 in 2013; 154 in 2014; 140 in 2015; 75 in first half of 2016), with diverse industrial and research applications using X-ray CT as means. This paper summarises the existence of the laboratory's first four years by way of selected examples, both from published and unpublished projects. In the process a detailed description of the capabilities and facilities available to users is presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 384, 1 October 2016, Pages 42-49
نویسندگان
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