کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8040667 | 1518664 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Element-sensitive computed tomography by fine tuning of PXR-based X-ray source
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Element-sensitive computed tomography (CT) experiments were carried out based on the absorption edge of a specific element using a finely tunable X-ray beam generated by parametric X-ray radiation (PXR). Tomographic images of specimens containing strontium were measured at energies both lower and higher than that of the Sr absorption edge. The difference between the images of the two energies successfully reveals the three-dimensional distributions of Sr. The results demonstrate that this method is effective for elemental analysis of considerably thick samples and could complement X-ray fluorescence analysis.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 355, 15 July 2015, Pages 251-256
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 355, 15 July 2015, Pages 251-256
نویسندگان
Y. Hayakawa, K. Hayakawa, M. Inagaki, T. Kaneda, K. Nakao, K. Nogami, T. Sakae, T. Sakai, I. Sato, Y. Takahashi, T. Tanaka,