کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8044600 | 1518921 | 2018 | 27 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Evidences of sensitization mechanism for PbSe thin films photoconductor
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Over the past decades, sensitization has been considered as a key process that determined the performance of lead selenide (PbSe) photoconductive detectors. However, insufficiency of evidences about the changes on material properties and structure in micro level becomes a barrier on comprehensive explanation of the sensitization mechanism. In this work, X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) technologies were employed to characterize the materials properties evolution process of PbSe during sensitization. Changes on microstructure was identified in details by high-resolution transmission electron microscope (HRTEM). Accordingly, we provided a profile of the sensitization mechanism in micro level. With these evidences, significant impacts on the photoconductive performances of PbSe could be well explained via the charge separation model.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 149, March 2018, Pages 190-194
Journal: Vacuum - Volume 149, March 2018, Pages 190-194
نویسندگان
Y.X. Ren, T.J. Dai, W.B. Luo, X.Z. Liu,