The structure and ferromagnetic properties of (Fe0.12CuxZn0.88−x)O thin films deposited on Si substrates by R.F. sputtering

► The Fe ions exist as Fe2+ in the Fe0.12CuxZn0.88−xO system, but Cu2+ and Cu1+ ions coexist. ► The Ms is 5.64 × 104 A/m for the as-grown Fe0.12Cu0.02Zn0.86O thin film. ► The ZnO thin films grown on the silicon substrate have a preferred orientation of (002).