کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
805234 | 905127 | 2010 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Diamond tool wear measurement by electron-beam-induced deposition
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موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی صنعتی و تولید
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Quantitative characterization of a diamond tool profile is critical to reveal tool wear mechanisms. An electron-beam-induced deposition (EBID) method reported previously is further developed and improved to measure diamond tool profiles using a field emission scanning electron microscope (SEM). The edge radius and wear land length for new and worn diamond tools were derived from analysis of the EBID-SEM images. Experimental results are presented to show that the methodology is an effective means to characterize diamond tool wear.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Precision Engineering - Volume 34, Issue 4, October 2010, Pages 718–721
Journal: Precision Engineering - Volume 34, Issue 4, October 2010, Pages 718–721
نویسندگان
M. Shi, B. Lane, C.B. Mooney, T.A. Dow, R.O. Scattergood,