EM algorithm for one-shot device testing with competing risks under exponential distribution

• ALT data analysis for one-shot devices with competing risks is considered.
• EM algorithm is developed for the determination of the MLEs.
• The estimations of lifetime under normal operating conditions are presented.
• The EM algorithm improves the convergence rate.

This paper provides an extension of the work of Balakrishnan and Ling [1] by introducing a competing risks model into a one-shot device testing analysis under an accelerated life test setting. An Expectation Maximization (EM) algorithm is then developed for the estimation of the model parameters. An extensive Monte Carlo simulation study is carried out to assess the performance of the EM algorithm and then compare the obtained results with the initial estimates obtained by the Inequality Constrained Least Squares (ICLS) method of estimation. Finally, we apply the EM algorithm to a clinical data, ED01, to illustrate the method of inference developed here.