کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8145294 | 1524093 | 2018 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Interface defect detection for composite insulators based on infrared thermography axial temperature method
ترجمه فارسی عنوان
تشخیص نقص رابط برای عایق کامپوزیت بر اساس روش دمای محوری دماسنج مادون قرمز
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کلمات کلیدی
عایق کامپوزیت نقص رابط تصویر مادون قرمز، درجه حرارت، بخاری گرم
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک اتمی و مولکولی و اپتیک
چکیده انگلیسی
Interface quality is one of the most important properties of composite insulators, and is hard to be effectively detected. Poor interface quality may lead to interface discharge or insulator fracture and hence threatens the safety of power systems. In order to detect interface defects of in-service composite insulators, 15 samples were collected from transmission lines in this paper. The dry power frequency voltage test and the steep-front impulse voltage test were conducted. The surface temperature after dry power frequency voltage test was recorded by infrared thermography. Then a method for quantitative characterization of composite insulator interface defects based on infrared thermal image axial temperature was proposed. By defining heating section according to temperature level of each sample, we summarized temperature distribution characteristics, including characteristics on location, length and maximum temperature point of heating sections. Our results show that the connection zone of composite insulators is prone to generate interface defects. Temperature analysis together with steep-front impulse voltage test results indicate that interface defects of test samples can be judged by the following three features of heating sections, namely, temperature rise (ÎT) above 80â¯K, ÎT above 20â¯K with 10â¯cm in length, and ÎT above 10â¯K with 40â¯cm in length.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Infrared Physics & Technology - Volume 93, September 2018, Pages 232-239
Journal: Infrared Physics & Technology - Volume 93, September 2018, Pages 232-239
نویسندگان
Jianguo Wang, Xiong Xiao, Yadong Fan, Li Cai, Yao Tong, Zhangquan Rao, Zhen Huang,