کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8165883 | 1526221 | 2018 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Irradiation study of a fully monolithic HV-CMOS pixel sensor design in AMS 180 nm
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
High-Voltage Monolithic Active Pixel Sensors (HV-MAPS) based on a 180 nm HV-CMOS process have been proposed to realize thin, fast and highly integrated pixel sensors. The MuPix7 prototype, fabricated in the commercial AMS H18 process, features a fully integrated on-chip readout, i.e. hit-digitization, zero suppression and data serialization. MuPix7 is the first fully monolithic HV-CMOS pixel sensor that has been tested for the use in high irradiation environments like HL-LHC. We present results from laboratory and test beam measurements of MuPix7 prototypes irradiated with neutrons (up to 5.0 à 1015 neq/cm2) and 24 GeV protons (up to 7.8 à 1015 protons/cm2) and compare the performance with non-irradiated sensors. At sensor temperatures of about 8 °C efficiencies of â¥90% at noise rates below 40 Hz per pixel are measured for fluences of up to 1.5 à 1015 neq/cm2. A time resolution better than 22 ns, expressed as Gaussian Ï, is measured for all tested settings and sensors, even at the highest irradiation fluences. The data transmission at 1.25 Gbit/s and the on-chip PLL remain fully functional.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 905, 11 October 2018, Pages 53-60
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 905, 11 October 2018, Pages 53-60
نویسندگان
H. Augustin, N. Berger, S. Dittmeier, J. Hammerich, A. Herkert, L. Huth, D. Immig, J. Kröger, F. Meier, I. PeriÄ, A.-K. Perrevoort, A. Schöning, D. vom Bruch, D. Wiedner,