Measurements and modeling of charge carrier lifetime in compressed xenon

Gamma-spectrometers based on high-pressure xenon gas (HPXe) are proving themselves as a great potential alternative to the spectrometers based on high-purity germanium crystals and scintillators. The working medium for the high-resolution HPXe detectors, that is, xenon gas compressed up to pressure ∼50 bar and sometimes doped with hydrogen, methane or others gases, needs to be of very high purity. The gas purity level can be determined by direct measurements or, alternatively, its usability in gamma-spectrometers can be evaluated indirectly through the charge carrier (electron) lifetime measurements. Different approaches and specific setups have been used for the lifetime determination, most of those methods involve the measurement and analyses of individual pulses from ionizing particles registered in an ionization chamber filled with Xe. In the present paper, we report on the HPXe electron lifetime study carried out by using measurements in a cylindrical ionization chamber and the respective analytical charge transport model. Our results support the possibility of carrier lifetime determination in the cylindrical configuration. In addition, the voltage regimes for the use of the chamber in the spectroscopic mode were determined. The measurements were conducted in a two-electrode configuration for a range of pressure values (5 to 50 bar) for the Xe+0.25%H2 gas mixture of ∼6N purity. It is shown that in gases with relatively high values of the electron drift velocity and the electron lifetime, for example low-density gases, the charge collection time measurements can give significantly underestimated lifetime assessment. On the other hand, for the low drift velocity gases, they give much more accurate results. With the use of the analytical model, the electron lifetime was determined more precisely.