کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8171720 | 1526323 | 2015 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Methods for measuring sub-pm rad vertical emittance at the Swiss Light Source
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We report on methods capable of measuring a rms vertical electron beam size of 3μm with a rms error of less than 10% at a diagnostic beamline at the Swiss Light Source (SLS). This corresponds to a vertical emittance of 0.6 pm rad with a 20% rms error. We showed this capability by presenting the theoretical basis for, and the data from, a series of measurements on a stable beam at 1.6 pm rad vertical emittance at the SLS. The methods presented utilized either Ï- or Ï-polarized synchrotron radiation (SR) in the visible to ultra violet (vis-UV) spectral range. In addition to the established Ï-polarization method, we introduced a diffraction method with a potentially high resolution capability. Also an intensity imbalanced diffraction scheme was introduced, but was found to be prone to SR induced carbon contamination on optical elements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 803, 11 December 2015, Pages 55-64
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 803, 11 December 2015, Pages 55-64
نویسندگان
J. Breunlin, Ã
. Andersson, N. Milas, Á. Saá Hernández, V. Schlott,