کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8171873 1526325 2015 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electronic noise in charge sensitive preamplifiers for X-ray spectroscopy and the benefits of a SiC input JFET
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Electronic noise in charge sensitive preamplifiers for X-ray spectroscopy and the benefits of a SiC input JFET
چکیده انگلیسی
A comprehensive summary and analysis of the electronic noise affecting the resolution of X-ray, γ-ray and particle counting spectroscopic systems which employ semiconductor detectors and charge sensitive preamplifiers is presented. The noise arising from the input transistor of the preamplifier and its contribution to the total noise is examined. A model for computing the noise arising from the front-end transistor is also presented and theoretical calculations comparing the noise contribution of transistors made of different materials are discussed, emphasizing the advantages of wide bandgap transistor technology.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 801, 21 November 2015, Pages 63-72
نویسندگان
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