کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8172170 | 1526327 | 2015 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High energy muon induced radioactive nuclides in nickel plate and its use for 2-D muon-beam image profile
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
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چکیده انگلیسی
Target materials were exposed to a muon beam with an energy of 160 GeV/c at the COMPASS experiment line in CERN-SPS to measure the production cross-sections for muon-induced radionuclides. A muon imager containing four nickel plates, each measuring 100 mmÃ100 mm, exposed to the IP plate successfully detected the muon beam image during an irradiation period of 33 days. The contrasting density rate of the nickel plate was (5.2±0.7)Ã10-9 PSL/muon per one-day exposure to IP. The image measured 122 mm and 174 mm in horizontal and vertical lengths, respectively, in relation to the surface of the base, indicating that 50±6% of the muon beam flux is confined to an area of 18% of the whole muon beam. The number of muons estimated from the PSL value in the total beam image area (0.81±0.1)Ã1013 was comparable to the total muon counts of the ion-chamber at the M2 beam line in the CERN-SPS. The production cross-sections of Cr-51, Mn-54, Co-56, Co-57, and Co-58 in nickel were 0.19±0.08, 0.34±0.06, 0.5±0.05, 3.44±0.07, 0.4±0.03 in the unit of mb, respectively, reducing muon associated particles effects. They are approximately 10 times smaller than that a proceeding study by Heisinger et al.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 799, 1 November 2015, Pages 54-58
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 799, 1 November 2015, Pages 54-58
نویسندگان
Y. Kurebayashi, H. Sakurai, Y. Takahashi, N. Doshita, S. Kikuchi, F. Tokanai, K. Horiuchi, Y. Tajima, T. Oe, T. Sato, S. Gunji, E. Inui, K. Kondo, N. Iwata, N. Sasaki, H. Matsuzaki, S. Kunieda,