کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8172196 | 1526328 | 2015 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A plastic scintillator-based muon tomography system with an integrated muon spectrometer
ترجمه فارسی عنوان
سیستم توموگرافی موون مبتنی بر پسیتلیکاتور پلاستیکی با یک اسپکترومنی یکپارچه ی مونو
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
چکیده انگلیسی
A muon scattering tomography system which uses extruded plastic scintillator bars for muon tracking and a dedicated muon spectrometer that measures scattering through steel slabs has been constructed and successfully tested. The atmospheric muon detection efficiency is measured to be 97% per plane on average and the average intrinsic hit resolution is 2.5Â mm. In addition to creating a variety of three-dimensional images of objects of interest, a quantitative study has been carried out to investigate the impact of including muon momentum measurements when attempting to detect high-density, high-Z material. As expected, the addition of momentum information improves the performance of the system. For a fixed data-taking time of 60Â s and a fixed false positive fraction, the probability to detect a target increases when momentum information is used. This is the first demonstration of the use of muon momentum information from dedicated spectrometer measurements in muon scattering tomography.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 798, 21 October 2015, Pages 12-23
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 798, 21 October 2015, Pages 12-23
نویسندگان
V. Anghel, J. Armitage, F. Baig, K. Boniface, K. Boudjemline, J. Bueno, E. Charles, P-L. Drouin, A. Erlandson, G. Gallant, R. Gazit, D. Godin, V.V. Golovko, C. Howard, R. Hydomako, C. Jewett, G. Jonkmans, Z. Liu, D. Waller,