کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8179055 | 1526394 | 2013 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9MeVcm2/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of ÏSEL<4.2Ã10â11cm2/(IonÃASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that have higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49Â years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3Ã10â3Â events/s. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 731, 11 December 2013, Pages 166-171
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 731, 11 December 2013, Pages 166-171
نویسندگان
Hiroshi Nakajima, Mari Fujikawa, Hideki Mori, Hiroaki Kan, Shutaro Ueda, Hiroko Kosugi, Naohisa Anabuki, Kiyoshi Hayashida, Hiroshi Tsunemi, John P. Doty, Hirokazu Ikeda, Hisashi Kitamura, Yukio Uchihori,