Comparative optical spectroscopy of gallium-nitride and aluminum-nitride nanostructures deposited onto silicon substrate

In the present work, a comparative study of optical spectroscopy of two kinds of samples, namely, gallium-nitride nanowires grown on silicon surface and aluminum-nitride thin film deposited also on silicon substrate has been carried out. The purpose of the study is to explain as much as possible the spectrums in relation with the surface details. It is shown that optical reflection spectroscopy in the visible would be a simple, fast and non-destructive tool for evaluating the nanostructures.