Detection analysis of phase-contrast X-ray imaging (PCXI) with single grid for nano-scopic applications

The phase-contrast X-ray imaging (PCXI) system has been developed incorporated with coherent X-rays applications. The coherent X-rays can be used for the design with the geometrical and physical variation where the interested factors are introduced for the scattering length scale. The internal shape of the object is obtained with the experiments of a table-top setup for a proof-of-concept method. The energy of X-ray needs to be lower in order to make the higher scattering length scale value. So, this work had proved that the lower X-ray energy has a better visibility in the image production. In addition, the increasing of the X-ray exposure time by frame increasing can make the better visibility in images. Furthermore, it is decided by the shorter grid period Po value for the better scattering length scale.