Sub-pixel dimensional measurement with Logistic edge model

To separate substandard workpieces from products, sub-pixel edge location with Logistic edge model is proposed for dimensional measurement. In the first step, workpiece rotation is corrected with high precision image rotation to reduce the measurement error and simplify the edge model. Secondly, Logistic edge model is utilized for fitting the discrete edge data to locate the sub-pixel workpiece edge and model parameters are estimated through the objective function in terms of the difference between assumed model and real image data. Finally, an edge pixel compensation method is presented with edge pixel compensation value, which weakens the effect of edge transition zone effectively. Experimental results demonstrate that the proposed method is effective for dimensional measurement with the relative error less than 0.05%.