Refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers

We propose refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers. The surface plasmon resonance modes and the sensing properties are theoretically analyzed using finite element method (FEM). In the calculation, Drude–Lorentz model is used to describe the Metal Dielectric constant. The calculation results show that the sensitivity of Ag-metalized SPR sensor can reach 1500 nm/RIU corresponding to a resolution of 6.67 × 10−5 RIU. Comparing with conventional detecting material-Au under the same structure, the sensitivity and 3 dB bandwidth of our device are better.