کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
851744 | 909335 | 2012 | 10 صفحه PDF | دانلود رایگان |

The intrinsic drawbacks of existing reliability-based algorithms, they often fail to handle wrapped phase data contains error sources, such as phase discontinuities, noise and undersampling. These algorithms often calculate the reliability only relying on the recorded pixel intensity or wrapped phase value, but the intensity of pixel always exist many noises. In this paper, we present a new method to define the reliability of pixel and path of phase unwrapping, the pixel's intensity and color are employed in fringe analysis simultaneously. The reliability function is calculated based on modulation, second difference of wrapped phase, and second difference of modulation, then we present the concept of smoothness of path, the reliability of path is calculated based on reliability of pixel and smoothness of path. Experiment results validate our proposed algorithm is more accurate than many previous algorithms. The proposed algorithm can be used to unwrap the complex phase map with discontinuous jump, and can be implemented with high efficiency without any manual interface.
Journal: Optik - International Journal for Light and Electron Optics - Volume 123, Issue 6, March 2012, Pages 537–546