کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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852172 | 909359 | 2010 | 6 صفحه PDF | دانلود رایگان |
In this paper a measurement method of three-dimensional profiles and a reconstruction system using subpixel localization with color gratings projection is described. The system has the effects of identical contrast on gratings for easier identification, switchable picture-in-picture on the display, and adjustable gratings with an adjustment module.The measurement method includes the following: the projection step; image extraction step; image fine-tuning step; subpixel localization processing step; and reconstruction step. A projection apparatus emits a grating towards a small lens under measurement, and forms a grating image on the small lens under measurement. The contrast values of the plurality of grating stripes of the grating image are identical. The grating image and picture-in-picture of a display can be fine-tuned and reconstruct the three-dimensional profiles of the small lens. This method can help improve measurement competence in the reverse engineering industry.
Journal: Optik - International Journal for Light and Electron Optics - Volume 121, Issue 23, December 2010, Pages 2122–2127