Processing and Properties of CuZr-Based Amorphous Microwires

In the paper, amorphous microwires of [(Zr43Cu50Al7)99.5Si0.5]99.9Y0.1 (Zr43) and Zr50.5Cu27.45Ni13.05Al9 (Zr50.5) alloys were fabricated by the melt-extraction technique. Their mechanical properties were evaluated by carrying out tensile and bending tests which show they have nearly the same strength. The cryogenic resistivity of CuZr-based amorphous microwires was investigated by four point probe method below 300 K. With the temperature increasing, the resistivity of these microwires decreases. Temperature coefficient of resistivity of these wires is close to zero, which manifests potential application as precision resistance material for its constant resistivity in such wide range of temperature.