Study of Analyzing Characteristic of Composition on the Surface of Copper Conductor Melted Marks

By using scanning electron microscope (SEM), x-ray energy distribution spectrometer (EDS) and Auger electron spectrometer (AES) to analyze copper conductor melted marks formed by short circuiting in normal atmosphere and fire atmosphere, environmental state when melted marks formed can be judged from contents of elements in composition on the surface of copper conductor melted marks so as to provide scientific bases for identifying fire cause. This paper discusses an analytical study of characteristic of composition on the surface of copper conductor melted marks by using the above three analytic methods.