کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9567324 | 1503713 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Depth profiling of the strain distribution in the surface layer using X-ray diffraction at small glancing angle of incidence
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In the studies of residual stresses of surface materials by using X-ray, in-depth distribution of the strain in the surface layer is necessary to be analyzed. We, therefore, characterized the refractive index of the surface layer materials with complex refractive index, which changes continuously in depth, and derived the X-ray intensity propagating during the surface layer materials. We applied this analyzing method to the experimental results of X-ray diffraction at small glancing angle incidence, and obtained the depth profile of the strain in the surface layer. The derived analyzing method can be applied to the residual stress distribution analysis of the surface layer materials of which densities change continuously in depth as multi thin films, compound plating layers.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 244, Issues 1â4, 15 May 2005, Pages 230-234
Journal: Applied Surface Science - Volume 244, Issues 1â4, 15 May 2005, Pages 230-234
نویسندگان
Y. Fujii, E. Yanase, K. Arai,