کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9567370 | 1503713 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry](/preview/png/9567370.png)
چکیده انگلیسی
Optical characterization of sol-gel deposited lanthanum nickel oxide, LaNiO3 (LNO) film on Pt-coated Si substrate was performed by spectroscopic ellipsometry and reflectometry. The sum of five Lorentz oscillators was used for LNO dispersion parameterization in spectral range from 190 to 1000Â nm. Two theoretical approaches: Raileigh-Rice theory (RRT) and effective medium approximation (EMA) were considered to account for the effect of LNO upper boundary roughness. Root mean square (rms) values of the heights of irregularities obtained by atomic force microscopy (AFM) and RRT were 2.09 and 5.62Â nm, respectively. Effective layer thickness in EMA approach was found to be 4.62Â nm. Higher values of roughness determined from optical methods with respect to the AFM may be assigned to the effect of convolution of AFM tip and boundary irregularities.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 244, Issues 1â4, 15 May 2005, Pages 431-434
Journal: Applied Surface Science - Volume 244, Issues 1â4, 15 May 2005, Pages 431-434
نویسندگان
Jan Mistrik, Tomuo Yamaguchi, Daniel Franta, Ivan Ohlidal, Gu Jin Hu, Ning Dai,