کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9567517 1503718 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
HRTEM and EELS characterization of atomic and electronic structures in Cu/α-Al2O3 interfaces
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
HRTEM and EELS characterization of atomic and electronic structures in Cu/α-Al2O3 interfaces
چکیده انگلیسی
Interfacial atomic structures of Cu/Al2O3(0 0 0 1) and Cu/Al2O3(112¯0) prepared by the pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM). It was found that (1 1 1) and (0 0 1) planes of Cu were epitaxially oriented to Al2O3(0 0 0 1) and Al2O3(112¯0) planes, respectively. Chemical bonding states at the interfaces were analysed by electron energy-loss spectroscopy (EELS). In oxygen-K edge energy-loss near-edge structure (O-K ELNES) of the Cu/Al2O3(0 0 0 1) and Cu/Al2O3(112¯0) interfaces, a shoulder peak appeared at the lower energy side of the main peak. This indicates that Cu-O interactions were formed across these Cu/Al2O3 interfaces. In fact, the simulated HRTEM images based on the O-terminated interface models agreed well with the experimental ones. It can be concluded that the O-terminated interfaces were formed in the present Cu/Al2O3 interfaces.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 241, Issues 1–2, 28 February 2005, Pages 87-90
نویسندگان
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