کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9567544 | 1503718 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation](/preview/png/9567544.png)
چکیده انگلیسی
Ultra-small angle X-ray scattering (USAXS) experiments were conducted with the BL15XU beamline (SPring-8) to perform a particle size distribution analysis of nano-powder, i.e. aggregations of particles with dimensions on the order of nanometers. The samples measured were amorphous nano-SiO2 powders of varying specific surface areas. Since a highly collimated and high-intensity X-ray beam is available, it is possible to obtain USAXS spectra that are only slightly affected by background noise. The USAXS spectra obtained from nano-SiO2 powders were analyzed by a modified Fankuchen technique, a method for particle size distribution analysis adapted by the authors. Using this technique, particle size distribution measurements can be performed over a wide range of particle diameters from 1 to 200Â nm. Since this method enables the particle size distribution of nano-powder to be accurately and easily determined, it is expected to be useful in a wide variety of fields.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 241, Issues 1â2, 28 February 2005, Pages 227-230
Journal: Applied Surface Science - Volume 241, Issues 1â2, 28 February 2005, Pages 227-230
نویسندگان
Hisayuki Hashimoto, Toshiaki Nagumo, Tohru Inaba, Yoichiro Furukawa, Masato Okui, Sei Fukushima,