کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9572295 | 1503706 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Stretched exponential degradation of oxide cathodes
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Stretched exponential degradation of oxide cathodes Stretched exponential degradation of oxide cathodes](/preview/png/9572295.png)
چکیده انگلیسی
In this study, the degradation behavior of oxide cathodes for cathode ray tubes (CRTs) is described using the stretched exponential model, which has been successfully used to describe the dynamics of complex systems characterized by heterogeneity. We derive a longevity equation from the two parameters: (i) characteristic life and (ii) heterogeneity parameter, which characterize the stretched exponential model. From the temperature dependences of the two parameters in the longevity equation, we reveal that the longevity follows the Arrhenius relation in oxide cathodes. The longevity equation and the Arrhenius relation enable us to predict the longevity in early life. The stretched exponential degradation is explained based on the heterogeneity of oxide cathodes.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 251, Issues 1â4, 15 September 2005, Pages 59-63
Journal: Applied Surface Science - Volume 251, Issues 1â4, 15 September 2005, Pages 59-63
نویسندگان
Byung Mook Weon, Jung Ho Je,