کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9594475 1507963 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Pit formation and segregation effects during Cu thin-film growth on Ag(1 1 1)
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Pit formation and segregation effects during Cu thin-film growth on Ag(1 1 1)
چکیده انگلیسی
The growth of 2-40 ML Cu on Ag(1 1 1) is investigated using scanning tunnelling microscopy (STM). The surface morphology of this bimetallic system appears to be dominated by Ag segregation. At large Cu coverages, a very moderate annealing favours the segregation process and the formation of characteristic pits penetrating through the Cu film. The segregation effect is evidenced by the (9 × 9) superstructure reported for one Ag monolayer deposited onto Cu(1 1 1). Some holes that penetrate well into the Ag substrate are interpreted as efficient diffusion paths for Ag atoms segregating towards the surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 596, Issues 1–3, 10 December 2005, Pages 45-52
نویسندگان
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