کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9594658 | 1507975 | 2005 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Polarized X-ray absorption spectroscopy and XPS of TiS3: S K- and Ti L-edge XANES and S and Ti 2p XPS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
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چکیده انگلیسی
Sulfur and Ti 2p XPS and polarized S K- and L2,3- and Ti L2,3-edge XANES spectra have been obtained from oriented ribbon-like crystals of TiS3 grown by vapor transport. The S 2p XPS spectrum for (0Â 0Â 1) crystal faces has line widths of 0.53Â eV and is completely accounted for by partially overlapped 2p3/2/2p1/2 doublets for sulfide (S2â) and disulfide (S22-) species, which are separate and independent entities in TiS3. Evidence of unsaturated surface states is lacking, consistent with a surface monolayer for the (0Â 0Â 1) growth face of disulfide atoms oriented with their charge-neutral sides outward. The S K-edge XANES spectra show pronounced anisotropy in the (0Â 0Â 1) plane of TiS3 crystals, associated with the photoelectron transition channel S 1sâ3pxÏuâ with the electric vector (E) parallel the a-axis (and the S-S bond of the disulfide group), and transitions to unoccupied antibonding orbitals of S-Ti bonds with E parallel to the b-axis (the direction of the well-known quasi-one-dimensional character of TiS3). The XPS and ultrasoft and soft X-ray region XANES spectra confirm the surface and near-surface structural integrity of TiS3.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 584, Issues 2â3, 20 June 2005, Pages 133-145
Journal: Surface Science - Volume 584, Issues 2â3, 20 June 2005, Pages 133-145
نویسندگان
M.E. Fleet, S.L. Harmer, X. Liu, H.W. Nesbitt,