کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9672253 1450565 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements
چکیده انگلیسی
Self-heating of silicon resistors (fabricated in polycrystalline and bulk silicon) which are used as passive devices in analog circuits and as ESD-Protection elements is characterised in this work by purely DC measurements. A methodology using the device simultaneously as heater and temperature sensor is presented. Extraction of thermal resistance is derived and discussed. Different types of resistors including a wide range of different geometries are characterised, the geometry dependence of the thermal resistance is determined for different resistor types. Theoretical models describing geometry dependence for thermal resistance are in very good agreement with the presented results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issues 7–8, July–August 2005, Pages 1187-1193
نویسندگان
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