کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9672253 | 1450565 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Self-heating of silicon resistors (fabricated in polycrystalline and bulk silicon) which are used as passive devices in analog circuits and as ESD-Protection elements is characterised in this work by purely DC measurements. A methodology using the device simultaneously as heater and temperature sensor is presented. Extraction of thermal resistance is derived and discussed. Different types of resistors including a wide range of different geometries are characterised, the geometry dependence of the thermal resistance is determined for different resistor types. Theoretical models describing geometry dependence for thermal resistance are in very good agreement with the presented results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issues 7â8, JulyâAugust 2005, Pages 1187-1193
Journal: Microelectronics Reliability - Volume 45, Issues 7â8, JulyâAugust 2005, Pages 1187-1193
نویسندگان
Martin Sauter,