کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9679507 | 1455082 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Wear-resistance comparison of carbon nanotubes and conventional silicon-probes for atomic force microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Wear-resistance comparison of carbon nanotubes and conventional silicon-probes for atomic force microscopy Wear-resistance comparison of carbon nanotubes and conventional silicon-probes for atomic force microscopy](/preview/png/9679507.png)
چکیده انگلیسی
In this paper, a comparison of the wear characteristics of carbon nanotube (CNT) probe and conventional silicon atomic force microscopy (AFM) probe in tapping mode by continuous scanning on a hard surface is reported. The results indicated that the conventional silicon probe wears greatly and its corresponding image resolution decreases greatly, and the scanned sample also wore, while the CNT probe and scanned sample showed no wear and the resolution remained unchanged. Therefore, the CNT probe has longer lifetime than the conventional probe and hence it is an ideal probe for AFM.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Wear - Volume 258, Issues 11â12, June 2005, Pages 1836-1839
Journal: Wear - Volume 258, Issues 11â12, June 2005, Pages 1836-1839
نویسندگان
Liqiu Guo, Rui Wang, Huaming Xu, Ji Liang,