کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9699767 | 1461937 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Etch-stop characteristics of heavily B/Ge-doped silicon epilayer in KOH and TMAH
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
الکتروشیمی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
This paper describes the characterization of a heavily boron/germanium (B/Ge)-doped silicon layer as an etch-stop in tetramethyl ammonium hydroxide (TMAH) and potassium hydroxide (KOH). We investigated the etch rate variation of heavily B/Ge-doped silicon epilayer as a function of varying temperature and/or concentration of the etchants. To facilitate the investigation, we described etch-stop performance by the etch-rate ratio of lightly phosphorous-doped and heavily boron/germanium-doped ã1Â 0Â 0ãsilicon. Results show that the etch-stop performance of boron/germanium-doped silicon is not as good as the heavily boron-only doped silicon with a similar boron doping level. However, the heavily B/Ge-doped silicon still exhibits good etch-stop performance. Tetramethyl ammonium hydroxide (TMAH) is recommended as an etchant of choice when B/Ge-doped silicon layer is used as an etch-stop layer. Specifically, experimental conditions with low concentrations and temperatures of TMAH lead to a good etch-stop ratio on the heavily B/Ge-doped silicon.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators A: Physical - Volumes 123â124, 23 September 2005, Pages 640-645
Journal: Sensors and Actuators A: Physical - Volumes 123â124, 23 September 2005, Pages 640-645
نویسندگان
Svetlana Tatic-Lucic, Wen-Yue Zhang, Navneet Navneet,