کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9700800 | 1462130 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
X-rays and electrical characterizations of ordered mesostructurated silica thin films used as sensing membranes
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: X-rays and electrical characterizations of ordered mesostructurated silica thin films used as sensing membranes X-rays and electrical characterizations of ordered mesostructurated silica thin films used as sensing membranes](/preview/png/9700800.png)
چکیده انگلیسی
Mesoporous silica (MPS) thin films were characterized by X-ray analysis and electrical measurements to investigate possible correlation between structural order and best response of this kind of sensing material toward RH and alcohols vapours. Both energy dispersive X-ray diffraction and X-ray reflectometry results have been discussed to describe the ordered porosity distribution in the amorphous film. A phenomenological trend of the resistive-type sensors response changing calcination has been found and related to the change in the porosity order of MPS thin film.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators B: Chemical - Volumes 111â112, 11 November 2005, Pages 145-149
Journal: Sensors and Actuators B: Chemical - Volumes 111â112, 11 November 2005, Pages 145-149
نویسندگان
Johnny Mio Bertolo, Andrea Bearzotti, Amanda Generosi, Lucrezia Palummo, Valerio Rossi Albertini,