کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9778010 | 1510568 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron spin resonance probing of fundamental point defects in nm-sized silica particles
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
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چکیده انگلیسی
Point defects in fumed 7-nm sized silica nanoparticles have been studied by K- and Q-band electron spin resonance (ESR) using vacuum ultra-violet irradiation to photo-dissociate H from passivated defects. Various types of ESR-active point defects are revealed, including the familiar Eâ² center (generic entity SiO3), EX, the peroxy radical, the methyl radical, and a newly observed approximately axially symmetric center (gâ¥Â = 2.0041, gâ¥Â = 2.0027). A possible atomic structure of the latter is discussed. The Eâ² defects are monitored as a function of thermal treatment in vacuum in the range 850-1175 °C in order to assess specific physical and chemical structural aspects of the particles. Experimental evidence is presented for the presence of two different systems of Eâ² centers. The specific ESR parameters of the Eâ² centers of one system are found to be very similar to those of the EγⲠcenter in bulk fused silica, while the second system has an enhanced statistical distribution of pertinent ESR principal values of the g matrix, primarily gâ¥, related to variations in local structure. It is inferred that the latter Eâ² system is located in the outer layers of the SiO2 particles, indicating a structure different from the interior of the particle, which appears similar to that of macroscopic silica samples.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 351, Issues 21â23, 15 July 2005, Pages 1764-1769
Journal: Journal of Non-Crystalline Solids - Volume 351, Issues 21â23, 15 July 2005, Pages 1764-1769
نویسندگان
A. Stesmans, K. Clémer, V.V. Afanas'ev,