کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9778063 | 1510569 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron irradiated potassium-silicate glass surfaces investigated by XPS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
In-situ fractured and electron irradiated potassium-silicate glass surfaces were studied by photoelectron spectroscopy. The surface enrichment by potassium and increasing ratio of non-bridging to bridging oxygen, NBO/BO, were determined as a function of electron dose quantitatively. Chemical bonding of atoms present in analysed volume were obtained by the line-shape analysis of Si 2p, O 1s, and K 2p photoelectron spectra using the pattern recognition methods. Results showed that even the freshly fractured glass surface is changed considerably in composition and chemical bonding. Electron irradiation preferentially formed potassium oxide with respect to elemental potassium. The O 1s line-shapes of irradiated glass followed those recorded from the vitreous SiO2 exposed to electron beam. The Si 2p line-shapes of irradiated glass were ascribed to those recorded from the vitreous SiO2 exposed to electron beam with the exception of the highest electron dose of 12Â 000Â C/m2. Here, Si-Si bond was recognised, accompanied with the highest content of oxidized potassium.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Non-Crystalline Solids - Volume 351, Issues 19â20, 1 July 2005, Pages 1665-1674
Journal: Journal of Non-Crystalline Solids - Volume 351, Issues 19â20, 1 July 2005, Pages 1665-1674
نویسندگان
J. Zemek, P. Jiricek, O. Gedeon, B. Lesiak, A. Jozwik,