کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9783055 | 1511868 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Flexural sensitivity of a V-shaped cantilever of an atomic force microscope
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The flexural sensitivity of a V-shaped cantilever of an atomic force microscope has been analyzed, taking into account the angle between the cantilever and the sample surface, including not only the normal interaction force, but also the lateral force, and an approximate solution is obtained using the Rayleigh-Ritz method. The results show that the effect of the cantilever slope on the sensitivity is significant. The sensitivity increases with decreasing slope when the contact stiffness is low. The flexural vibration mode of the V-shaped cantilever is more sensitive than that of a uniform cross-section cantilever. However, when the contact stiffness becomes large, the situation is reversed. Furthermore, decreasing the width and increasing the leg length increase the flexural sensitivity when the contact stiffness is low. Increasing the tip length increases the flexural sensitivity when the contact stiffness is high.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 92, Issues 2â3, 15 August 2005, Pages 438-442
Journal: Materials Chemistry and Physics - Volume 92, Issues 2â3, 15 August 2005, Pages 438-442
نویسندگان
Haw-Long Lee, Win-Jin Chang, Yu-Ching Yang,