کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9784046 | 1512028 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Piezoresponse force microscopy studies of nanoscale domain structures in ferroelectric thin film
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
Piezoresponse force microscopy was used to perform studies of nanoscale domain imaging, limit of ferroelectric nano-sized grains and electric field-induced displacement behavior of domain structures in ferroelectric PZT thin film. Nanoscale 180° and 90° domain configurations as small as 30 nm in size were clearly visualized in the individual grains. It was demonstrated that domain configuration was strongly dependent on the size of the grains. The limit of ferroelectric nano-sized grains was found to be smaller than 25 nm. Nanoscale displacement versus field hysteresis loops were obtained in ferroelectric domains of PZT thin film, and discussed in terms of phenomenological theory.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 120, Issues 1â3, 15 July 2005, Pages 104-108
Journal: Materials Science and Engineering: B - Volume 120, Issues 1â3, 15 July 2005, Pages 104-108
نویسندگان
H.R. Zeng, H.F. Yu, X.G. Tang, R.Q. Chu, G.R. Li, Q.R. Yin,