کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9795631 | 1514932 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry](/preview/png/9795631.png)
چکیده انگلیسی
Cu rods have been deformed by equal channel angular pressing (ECAP) up to shear strains γ â 5 while applying various deformation paths A, BC and C. X-ray Bragg profile analyses (XPA), differential scanning calorimetry (DSC) as well as residual electrical resistivity (RER) measurements have been performed, in order to detect the densities of various deformation induced lattice defects and/or their arrangements. The results have been analysed in terms of annealing of deformation induced dislocations and vacancies (vacancy agglomerates). Compared to conventional cold work procedures, deformation by ECAP achieves a strongly enhanced concentration of vacancy type defects.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volumes 410â411, 25 November 2005, Pages 169-173
Journal: Materials Science and Engineering: A - Volumes 410â411, 25 November 2005, Pages 169-173
نویسندگان
E. Schafler, G. Steiner, E. Korznikova, M. Kerber, M.J. Zehetbauer,