کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9796094 1514941 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Dislocation density tensor identification by coupling micromechanics and X-ray diffraction line broadening
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Dislocation density tensor identification by coupling micromechanics and X-ray diffraction line broadening
چکیده انگلیسی
An inverse approach to dislocation microstructure analysis is presented, able to provide dislocation density, character of the activated dislocations and range of the corresponding distortion field. It is based on the coupling between the micromechanical dislocation theory (providing the distortion field within a given crystal) with X-ray line profile analysis (relating a distortion field with the broadening of diffraction line profiles). In particular, lattice distortion is calculated by using both the dislocation density tensor (expressing the incompatibility of the microstructure) and the general Green's function formalism (characterizing the interaction between lattice spatial positions) whereas a Fourier treatment is used to evaluate the X-ray diffraction line broadening. Within the proposed formalism, the case of a periodic arrangement of dislocations is analysed, and numerical simulations, compared with high resolution X-ray diffraction, are shown to provide results quantitatively compatible with literature data both on dislocation density, arrangement and mean distance.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volumes 400–401, 25 July 2005, Pages 142-145
نویسندگان
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