کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9801903 | 1515734 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films](/preview/png/9801903.png)
چکیده انگلیسی
Landau-Devonshire theory is used to investigate the effect of external mechanical stress (or strain) on domain structure and the remanent polarization of Pb(Zr0.35Ti0.65)O3 (PZT) thin films, by considering the competition between the external stress and the intrinsic stresses. A set of intrinsic stress functions in PZT film is obtained by solving elastic mechanical equations. At room temperature, the intrinsic stresses may lead to an alternate a/c/a/c domain structure. While an external in-plane tensile stress increases the Gibbs free energy of the c-phase and decreases that of a-phase. Parts of the c-domains turn to a-domains, so as to reduce the remanent polarization of the PZT films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Communications - Volume 135, Issues 11â12, September 2005, Pages 703-706
Journal: Solid State Communications - Volume 135, Issues 11â12, September 2005, Pages 703-706
نویسندگان
Li-Ben Li, Xiu-Mei Wu, Xiao-Mei Lu, Jing-Song Zhu,