کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817440 | 1518765 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High-brightness hard X-ray scanning nano-probes at NSLS II
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
There is high demand for materials characterization on the nanometer length scale using hard X-ray techniques at third-generation X-ray synchrotron sources. For this reason, there are intense efforts underway for improving the quality and design of the X-ray optics that deliver these nano-focused X-ray beams. The proposed NSLS-II ultra-low emittance 3 GeV electron storage ring will provide the necessary brightness to deliver 10 nm spatial-resolution to a variety of dedicated nanoprobe beamlines at this facility. In this paper, we explore how this resolution can be attained using several types of X-ray optics, and also how their performance would compare at the present NSLS second-generation X-ray source.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 238-241
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 238-241
نویسندگان
James M. Ablett,