کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817464 | 1518765 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
A new generation of secondary neutral mass spectrometry (SNMS) instruments has been developed that is especially designed for laser post-ionization (LPI). These instruments combine high useful yield and high background discrimination. Results presented here demonstrate that these instruments can detect one in every four atoms removed from a samples surface - a greater than one order of magnitude improvement over current large frame secondary ion mass spectrometry instruments. Because of their high sensitivity, these new LPI-SNMS instruments are especially amenable to analysis of samples of limited size and rare one-of-a-kind samples. Such an application is analysis of samples returned to Earth from space by the Genesis and Stardust Discovery missions of NASA.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 356-360
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 356-360
نویسندگان
Igor V. Veryovkin, Wallis F. Calaway, C. Emil Tripa, Jerry F. Moore, Andreas Wucher, Michael J. Pellin,