کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817479 | 1518765 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Improvement in the low energy collection efficiency of Si(Li) X-ray detectors
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for energy dispersive spectroscopy. However, the measurement of X-rays below 1 keV is compromised by absorption in the material layers in front of the active crystal and a dead layer at the crystal surface. Various Schottky barrier type contacts were investigated resulting in a 40% reduction of the dead-layer thickness and a factor of two increased sensitivity at carbon Kα compared to the standard Si(Li) detector. Si(Li) detectors were tested on the U7A soft X-ray beam-line at the National Synchrotron Light Source and on a scanning electron microscope (SEM).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 436-440
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 241, Issues 1â4, December 2005, Pages 436-440
نویسندگان
Christopher E. Cox, Daniel A. Fischer, Willi G. Schwarz, Yongwei Song,