کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9817491 1518766 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Material dependence of total electron emission yields following slow highly charged ion impact
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Material dependence of total electron emission yields following slow highly charged ion impact
چکیده انگلیسی
The total electron emission yields following the interaction of “Slow (⩽2 keV/a.u.) Highly Charged Ions” (SHCI) (O3+⋯7+, Xe12+⋯52+, Au54+⋯69+) with different target surfaces (highly-oriented pyrolytic graphite (HOPG), Au and SiO2) have been measured. The emission yields increase with charge state, and is found to be highest for carbon, the HOPG target, and lowest for the SiO2 target. An empirical formula for the electron emission is including recent results from investigations of plasmon excitation following SHCI impact are used to interpret the results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issue 4, December 2005, Pages 829-833
نویسندگان
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